000 00447nam a22001697a 4500
003 NUST - PNEC
005 20170116181001.0
008 150912b xxu||||| |||| 00| 0 eng d
020 _a0750694726
040 _cLIBRARY
082 _a621.381548 AFS
100 _99532
_a Afshar, Amir
245 _aPrinciples of semiconductor network testing
_cAmir Afshar
260 _cc.1995
650 _99533
_aSemiconductors--Testing
_xEL
942 _2ddc
_cBK
999 _c66715
_d66715