| 000 | 00454nam a22001697a 4500 | ||
|---|---|---|---|
| 003 | NUST - PNEC | ||
| 005 | 20170116181010.0 | ||
| 008 | 150913b xxu||||| |||| 00| 0 eng d | ||
| 020 | _a8173190038 | ||
| 040 | _cLIBRARY | ||
| 082 | _a621.38152 VAY | ||
| 100 |
_910120 _aVaya, P. R. |
||
| 245 |
_aSemiconductor materials: Characterization techniques _cP. R. Vaya |
||
| 260 | _cc.1993 | ||
| 650 |
_910123 _aSemiconductor materials _xEE |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c67058 _d67058 |
||