| 000 | 01042pam a2200289 a 4500 | ||
|---|---|---|---|
| 001 | 3904843 | ||
| 003 | NUST - PNEC | ||
| 005 | 20170116181053.0 | ||
| 008 | 910227s1992 nyua 001 0 eng | ||
| 010 | _a 91011690 | ||
| 020 | _a0029463459 | ||
| 020 | _a067521162X | ||
| 040 |
_aDLC _cLIBRARY _dDLC |
||
| 050 | 0 | 0 |
_aTK7878.4 _b.B79 1992 |
| 082 | 0 | 0 | _a621.38154 BUC |
| 100 | 1 | _aBuchla, David M. | |
| 245 | 1 | 0 |
_aApplied electronic instrumentation and measurement / _cDavid Buchla, Wayne McLachlan. |
| 260 |
_aNew York : _bMerrill ; _aToronto : _bCollier Macmillan Canada ; _aNew York : _bMaxwell Macmillan International Pub. Group, _cc1992. |
||
| 300 |
_axviii, 830 p : _bill. ; _c24 cm. |
||
| 500 | _aIncludes index. | ||
| 650 | 0 | _aElectronic instruments. | |
| 650 | 0 |
_aElectronic measurements. _xEL, EE |
|
| 700 | 1 | _aMcLachlan, Wayne. | |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 955 | _apc01 to ba00 02-27-91; ba30 to SCD 02-27-91; fg11 02-28-91; fq21 03-06-91; CIP ver. ta06; to SL 11-01-91 | ||
| 999 |
_c68450 _d68450 |
||