NUST Institutions Library Catalogue

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Genetic algorithms for VLSI design, layout & test automation Mazumder Pinaki

by Mazumder, Pinaki | Elizabeth M. Rudnick.

Publisher: New Delhi : Pearson Education Inc. , c2003Availability: Items available for loan: Central Library (CL)Call number: 621.395 MAZ (1).
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VLSI test principles and architectures: design for testability design for testability edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

by Wang, Laung-Terng | Wu, Cheng-Wen | Wen, Xiaoqing.

Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006Other title: VLSI test principles and architectures.Availability: Items available for loan: Central Library (CL)Call number: 621.395 WAN (1).
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LSI/VLSI testability design / Frank F. Tsui.

by Tsui, Frank F.

Publisher: New York : McGraw-Hill, c1987Availability: Items available for loan: Military College of Signals (MCS)Call number: 621.395,TSU (1).
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Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits-(E-BOOK) Michael L. Bushnell, Vishwani D. Agrawal

by Bushnell, Michael L | Agrawal, Vishwani D.

Publisher: Boston : Kluwer Academic, cop. 2000Availability: Items available for loan: Military College of Signals (MCS)Call number: 621.395 BUS (1).
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BUILT IN TEST FOR VLSI, PSEUDORANDOM TECHNIQUES

by SAVIR, J, MCANNEY, W. H, BARDELL, PAUL H.

Material type: Text Text Publisher: NWEWYORK JOHN WILEY 1987Availability: Items available for loan: College of Electrical & Mechanical Engineering (CEME)Call number: 621.38173 BAR'B (1).
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